This book presents the art of advanced MOSFET modeling for integrated circuit simulation and design. It provides the essential mathematical. BSIM and IC simulation. Circuit simulation and compact models. BSIM – the beginning. BSIM3 – a compact model based on new MOSFET physics. : BSIM4 and MOSFET Modeling for IC Simulation (International Series on Advanced in Solid State Electronics and Technology).

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BSIM4 junction leakage due to trap-assisted tunneling [4].

Nielsen Book Data The intent of this book ch. Intrinsic charge and capacitance models. Diode temperature-dependence model [4].

BSIM4 and MOSFET Modeling For IC Simulation

Describe the connection issue. Gate direct-tunneling current theory and model. Noise representations and parameters. Source and drain parasitics: World Scientific Publishing Co.

SearchWorks Catalog

Gate and channel geometries and materials. Bibliography Includes bibliographical references and index. Circuit simulation and compact models. Velocity saturation and velocity overshoot. Review of the charge-deficit transient NQS model. Gate intrinsic-input resistance for non-quasi-static modeling.


Saturation junction leakage current and zero-bias capacitance models. It provides the essential mathematical and physical analyses of all the electrical, mechanical and thermal effects in MOS transistors relevant to the operation of integrated circuits. Charge and capacitance models. Channel DC current and output simulwtion.

Time discretization, equation linearization and matrix stamping. SearchWorks Catalog Stanford Libraries. Fringing and overlap capacitances.

BSIM4 and MOSFET modeling for IC simulation – CERN Document Server

BSIM4 channel thermal noise models. Publication date Series International series on nosfet in solid state electronics and technology Reproduction Electronic reproduction.

Output resistance in saturation region.

Channel current in subthreshold and linear operations. Series International series on advances in solid state electronics and technology. Responsibility Weidong Liu, Chenming Hu. Composite stamps for transient NQS model.

Imprint Singapore ; Hackensack, N. Gate direct-tunneling and body currents. Junction diode IV and CV models. Special attention is paid to MOSFET characterization and model parameter extraction methodologies, making the book particularly useful for those interested or already engaged modeljng work in the areas of semiconductor devices, compact modeling for SPICE simulation, and integrated circuit design.


ISBN electronic bk.

Physical mechanisms of diode DC currents. The discussion covers the theory and methodology of how a MOSFET model, or semiconductor device models in general, can be implemented to be robust and efficient, turning device physics theory into a production-worthy SPICE simulation ,odeling. Find it at other libraries via WorldCat Limited preview. Single continuous channel charge model.

Source and drain of a transistor with multiple gate fingers.